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SC20 Virtual Platform
Online Machine Learning for SEM Image Classification
Event Type
ACM Student Research Competition: Graduate Poster
ACM Student Research Competition: Undergraduate Poster
Student Program
Registration Categories
TimeWednesday, 18 November 20208:30am - 5pm EST
LocationPoster Module
DescriptionMachine learning offers a potential solution to the the increasing volume and velocity of experimental data. We explore the use of machine learning methods to automate focus detection of images ac- quired from scanning electron microscopes (SEMs). Specifically, we apply Laplacian of Gaussian blob detection using a user-specified threshold and a convolutional neural network to determine the focus of an image. We further explore performance of both individual and ensemble-based approaches with overall accuracy of up to 92%. We have published our models in the Data and Learning Hub (DLHub) to enable them to be applied to data as they are acquired.
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